By Ladislaus Marton
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Extra resources for Advances in Electronics and Electron Phisics. Vol. 43
And Millward, G. R. (1970). J. Ultrastruct. Res. 31, 203. Garrod, R. , and Nankivell, J. F. (1958). Brit. J. Appl. Phys. 9, 214. Glick, A. J. (1965). In “Qualitative Electron Microscopy” (G. F. Bahr and E. M. ), p. 49. Williams & Wilkins, Baltimore, Maryland. Goldfischer, L. I. (1965). J . Opt. Am. 55, 247. Hall, C. E. (1953). ” McGraw-Hill, New York. Hanszen, K. J. (197 1). Adu. Opt. Electron Microsc. 4, 1. Hanszen, K. J. (1973). In “Image Processing and Computer-aided Design in Electron Optics” (P.
Separation of Superimposed Images It has already been discussed in the preceding sections that an electron micrograph is a projection of the specimen on the plane of the photographic plate. For example, in the case of a specimen observed in negative contrast, for which the image is that provided from the distribution of the negative stain around the specimen, both the near and far surfaces with respect to the supporting film contribute to the final image on which they turn out to be superimposed (Klug and De Rosier, 1966).
46) and (47) that la,( = 10-D’2 (481 Taking into account the definition of the photographic contrast C,, we then have 19 ELECTRON MICROGRAPH ANALYSIS where I a, I depends exponentially on C, . **I (51) The optical system thus provides the micrograph’s contrast transform, with the approximation that corresponds to neglecting all of the terms following the second one in the expansion of I a, I in a power series. , can be found in the output signal of the optical system. Since the width of the spectral band of these terms is two or three times the width of the SC, (Bracewell, 1965), these terms generate parasite signals.
Advances in Electronics and Electron Phisics. Vol. 43 by Ladislaus Marton